
Profilm 3D

Features
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Vertical scanning and phase shifting interferometry for measurement of surface features from nanometers to millimeters
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Automated X-Y stage with a long travel range, great for mapping and stitching scans
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Automated focus with industry-leading long piezo travel range for scanning multiple surfaces separated by large height distances
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Intuitive software suite including advanced Profilm desktop, the cloud-based ProfilmOnline and mobile applications for flexible data storage, visualization and analysis
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TotalFocus imaging, resulting in stunning True Color images with every pixel in focus, even on surfaces with height variation larger than the objective’s depth-of-focus
Applications
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Step height: 3D step height from nanometers to millimeters
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Texture: 3D roughness and waviness
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Form: 3D bow and shape
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True Color: TotalFocus image of the 3D surface topography
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Edge rolloff: 3D edge profile measurements
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Defect review: 3D defect surface topography
iMicro

Features
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InForce 1000 actuator for capacitance displacement measurement and electromagnetic force actuation with interchangeable tips
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Optional InForce 50 actuator provide maximum 50mN normal force for measuring soft materials, and optional Gemini 2D force transducer for two-axis dynamic measurement. Unique software-integrated tip-calibration system for fast, accurate tip calibration
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InQuest high-speed controller electronics with 100kHz data acquisition rate and 20µs time constant
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XY motion system with easy mounting magnetic sample holder
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High stiffness gantry with integrated vibration isolation
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Integrated microscope with digital zoom for precise indentation targeting
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ISO 14577 and standardized test methods
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InView software package with RunTest, ReviewData, InFocus reporting, InView University online training and InView mobile application
Applications
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Hardness and modulus measurements (Oliver-Pharr)
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High speed material property maps
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ISO 14577 hardness testing
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Polymer tan delta, storage and loss modulus
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Quantitative scratch and wear testing
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High Temperature Nanoindentation Testing

NanoFlip
Features
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InForce 50 actuator for capacitance displacement measurement and electromagnetic force actuation with interchangeable tips
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InQuest high-speed controller electronics with 100kHz data acquisition rate and 20µs time constant
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XYZ motion system for sample targeting
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SEM video capture for synchronized SEM images with test data
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Unique software-integrated tip-calibration system for fast, accurate tip calibration
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InView control and data review software with Windows ®10 compatibility and method developer for user-designed experiments
Applications
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Hardness and modulus measurements (Oliver-Pharr)
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Continuous stiffness measurement
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High speed material property maps
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ISO 14577 hardness testing
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Nano Dynamic Mechanical Analysis (DMA)
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Quantitative scratch and wear testing

T150 UTM
Features
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Electromagnetic transducer for high sensitivity over a large range of strain
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Dynamic characterization mode for measurement of evolution of mechanical properties with strain
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Flexible, upgradeable and configurable system for a variety of applications
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Easy test protocol development for real-time experimental control
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Compliant with ASTM standards
Applications
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Thin individual polymers, metals, composite or ceramic fibers
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Electrospun polymer nanofibers
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Polymer films
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Biomaterials (e.g., spider silk, soft tissue scaffold)
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Textiles
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MEMS: Micro-electro-mechanical systems

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